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[33802] Artykuł:

Characterisation of Ni-C films obtained in PVD/CVD process

Czasopismo: Central European Journal of Physics   Tom: 9, Zeszyt: 2, Strony: 330-337
ISSN:  1895-1082
Wydawca:  VERSITA, SOLIPSKA 14A-1, 02-482 WARSAW, POLAND
Opublikowano: Kwiecień 2011
 
  Autorzy / Redaktorzy / Twórcy
Imię i nazwisko Wydział Katedra Procent
udziału
Liczba
punktów
Justyna Kęczkowska orcid logoWEAiIKatedra Telekomunikacji, Fotoniki i Nanomateriałów *****10020.00  

Grupa MNiSW:  Publikacja w czasopismach wymienionych w wykazie ministra MNiSzW (część A)
Punkty MNiSW: 20
Klasyfikacja Web of Science: Article


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Keywords:

PVD method  CVD method  Ni-C films  Raman spectroscopy  carbon nanotubes 



Abstract:

The work presents the results of the scanning electron microscopy (SEM) and Raman spectrometry studies of carbonaceous nanostructures containing nickel nanocrystallites. The films were obtained using a two-step method. In the first phase the Physical Vapour Deposition (PVD) method was applied, whereas in the second Chemical Vapour Deposition (CVD) method was used. The paper presents results for samples with various Ni content obtained with different parameters of the two-phase technological process. The research confirms that the thin films obtained by PVD method contain Ni nanocrystallites distributed in a carbonaceous matrix. The matrix is composed of various carbon allotropes (amorphous carbon, graphite, fullerene). The thin films made by CVD method make a matrix when multiwalled, carbonaceous nanotubes are obtained. Depending on the technological process parameters of each phase, we obtain multiwall nanotubes with a various degree of defects.