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[38582] Artykuł:

Review of the Results of the COST MP0702 Exercise on the Sensitivity of Metal-Dielectric Layered Flat Lens to Fabrication Inaccuracies

Czasopismo: Proceedings of 13th International Conference on Transparent Optical Networks ICTON 2011, Stockholm, Sweden, June 26 – 30, 2011   Strony: 1-4
ISBN:  978-1-4577-0880-0
Wydawca:  IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Opublikowano: 2011
 
  Autorzy / Redaktorzy / Twórcy
Imię i nazwisko Wydział Katedra Procent
udziału
Liczba
punktów
T. Stefaniuk13.00  
R. Kotyński13.00  
H. Baghdasaryan13.00  
A. Pastuszczak13.00  
Marian MarciniakInstytut Łączności - Państwowy Instytut Badawczy13.00  
A. Lavrinenko13.00  
K. Panajotov13.00  
T. Szoplik13.00  

Grupa MNiSW:  Materiały z konferencji międzynarodowej (zarejestrowane w Web of Science)
Punkty MNiSW: 0
Klasyfikacja Web of Science: Proceedings Paper


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Keywords:

Plasmonics  nanophotonics  nanolenses  superresolution  multilayers  finite-difference time-domain method  single expression method  transfer matrix method  effective medium theory 



Abstract:

We summarise the results of the COST MP0702 exercise on the sensitivity of metal-dielectric layered superlens to fabrication inaccuracies. The major results of this joint task have been already published in Ref. 1, Opto-Electronics Review, vol. 18(4), pp. 446-457, 2010. The numerical analysis of the superlens is based on the transfer matrix method, the finite-difference time-domain technique, and the method of single expression, and is compared with a simplified effective medium approach. The lens is designed for imaging with subwavelength resolution at wavelength of 441 nm. Its operation may be attributed to self-collimation with a secondary role of Fabry-Perot resonant transmission. We have estimated the resolution, transmission efficiency and sensitivity with respect to fabrication inaccuracies of this superlens. The tolerance analysis indicates that the resolution and transmission efficiency are highly sensitive to even small changes of layer thicknesses.