Notice: Undefined index: linkPowrot in C:\wwwroot\wwwroot\publikacje\publikacje.php on line 1275
[63410] Artykuł: SEM and Raman studies of CNT films on porous SiCzasopismo: Proceedings of SPIE Tom: 10445, Strony: 1-8ISSN: 1996-756X ISBN: 978-1-5106-1355-3 Wydawca: SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA Opublikowano: Sierpień 2017 Seria wydawnicza: Proceedings of SPIE Liczba arkuszy wydawniczych: 0.70 Autorzy / Redaktorzy / Twórcy Grupa MNiSW: Materiały z konferencji międzynarodowej (zarejestrowane w Web of Science) Punkty MNiSW: 15 Klasyfikacja Web of Science: Proceedings Paper DOI Web of Science Keywords: CNT films  porous Si  Raman Spectroscopy  SEM  |
Carbon nanotube (CNT) films deposited on different porous silica substrates were studied by Scanning Electron Microscopy (SEM) and Raman Spectroscopy (RS). The films samples were prepared by a two-step method consisting of PVD and CVD processes. In the first step the nanocomposite Ni-C film was obtained by evaporation in dynamic vacuum from two separated sources of fullerenes and nickel acetate. Those films were deposited on porous silica and DLC/porous silica substrates. Analysis of SEM imaging showed that the obtained film are composed of carbon nanotubes, the distribution, size and quality of which depend on the type of substrate. The CNT films were studied by RS method to determine the influence of the substrate type on disordering of carbonaceous structure and quality of CNT in deposited films.